Taipei, Taiwan

Tzu-Heng Liu

This inventor holds 1 USPTO granted patent. Top assignee: Lite-On Semiconductor Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tzu-Heng Liu. Retrieved from https://idiyas.com/inventor/tzu-heng-liu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2008

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Tzu-Heng Liu: Inventor of a Fingerprint-Scanning Image-Sensing Module

Introduction

Tzu-Heng Liu is an inventor associated with Taipei, Taiwan, and Lite-On Semiconductor Corporation. His listed patent concerns a contact image-sensing module that combines image sensing with fingerprint scanning.

Latest Patents

Liu is credited with 1 patent: “Contact Image-Sensing Module Having Fingerprint Scanning Function.” The invention describes a module built around a flex-and-rigid composite substrate. Three rigid circuit substrates connect electrically to at least one flexible circuit board, forming composite substrates. The second and third composite substrates are positioned at predetermined angles relative to the plane of the first, creating a three-dimensional arrangement for the sensing module.

Career Highlights

The available information identifies Liu’s work with Lite-On Semiconductor Corporation and highlights his contribution to fingerprint-sensing technology. His patent describes a structural approach to integrating image-sensing components and circuit substrates in a compact module.

Collaborations

Ming-Ho Wang and Chia-Chu Cheng are listed as Liu’s coworkers. The available details do not specify whether they collaborated with him on this patent.

Conclusion

Tzu-Heng Liu’s listed patent reflects an engineering contribution to contact image-sensing modules with fingerprint-scanning functionality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…