Buffalo Center, IA, United States of America

Tyler B Henn

This inventor holds 2 USPTO granted patents and 2 published patent applications. Top assignee: 3M Innovative Properties Company. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tyler B Henn. Retrieved from https://idiyas.com/inventor/tyler-b-henn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 11.0

ph-index = 1


Company Filing History:


Years Active: 2025

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2 patents (USPTO):Explore Patents

Title: Innovations of Tyler B Henn

Introduction

Tyler B Henn is an accomplished inventor based in Buffalo Center, IA (US). He has made significant contributions to the field of safety apparatuses, particularly in aerial lift technology. With a total of 2 patents, Henn's work focuses on enhancing safety measures for users of aerial lifts.

Latest Patents

Henn's latest patents include an innovative design for an aerial lift interlocked with a fall-protection safety apparatus. This aerial lift is equipped with a monitoring system that detects whether a connector of a safety line is properly connected to a safety harness of the user. This design aims to prevent accidents and ensure the safety of individuals operating aerial lifts.

Career Highlights

Tyler B Henn is associated with 3M Innovative Properties Company, where he continues to develop and refine his inventions. His work is characterized by a commitment to improving safety standards in the industry.

Collaborations

Henn collaborates with notable colleagues such as Jonathan J Lepp and Christopher J Reineke, contributing to a dynamic team focused on innovation and safety.

Conclusion

Tyler B Henn's contributions to aerial lift safety technology exemplify his dedication to innovation and safety in the workplace. His patents reflect a forward-thinking approach that prioritizes user safety and efficiency.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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