Company Filing History:
Years Active: 2023
Title: Tyler Albarran: Innovator in Integrated Circuit Failure Assessment
Introduction
Tyler Albarran is a notable inventor based in Boston, MA, who has made significant contributions to the field of integrated circuits. His innovative work focuses on developing systems that enhance the reliability and performance of electronic components. With a keen understanding of technology and engineering, Tyler has successfully patented a unique method for assessing failures in integrated circuits.
Latest Patents
Tyler holds a patent for a "System and method for performing a failure assessment of an integrated circuit." This patent describes a sophisticated system that includes a hardware subsystem and a control subsystem designed to manage operations performed by the hardware. The system is capable of altering the duration of clock cycles on the integrated circuit and can halt the clocking signal at a specific cycle. Through a binary search method, the system identifies failure points by determining when a failure occurs during the clock cycles. This innovative approach allows for precise data extraction from circuit components, enhancing the overall assessment process.
Career Highlights
Currently, Tyler is employed at Marvell Asia Pte., Ltd., where he continues to push the boundaries of technology in integrated circuits. His work at Marvell has positioned him as a key player in the development of advanced electronic systems. Tyler's dedication to innovation is evident in his successful patent and his ongoing contributions to the field.
Collaborations
Tyler collaborates with talented professionals such as Zahi Abuhamdeh and Nitin Mohan, who share his passion for technological advancement. Together, they work on projects that aim to improve the functionality and reliability of integrated circuits.
Conclusion
Tyler Albarran's contributions to the field of integrated circuits through his innovative patent demonstrate his expertise and commitment to advancing technology. His work not only enhances the understanding of failure assessments but also paves the way for future innovations in electronic systems.