This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Analytical Science Finland Oy. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Tuomas Pylkkaenen: Innovator in Radiation Detection Technology
Introduction
Tuomas Pylkkaenen is a notable inventor based in Espoo, Finland. He has made significant contributions to the field of radiation detection technology. His innovative work has led to the development of a unique patent that enhances the functionality of radiation detectors.
Latest Patents
Tuomas holds a patent for a "Multilayer collimator, and method for manufacturing a multilayer collimator." This invention involves a multilayer collimator designed for radiation detectors. It comprises a first layer made of a first attenuator material and a second layer of a second attenuator material, each featuring a coincident opening. The second attenuator material has a smaller atomic mass than the first. The design includes an extension that departs from the plane of the second layer, ensuring that the first and second layers are locked into an assembled configuration.
Career Highlights
Tuomas Pylkkaenen is associated with Hitachi High-Tech Analytical Science Finland Oy, where he applies his expertise in developing advanced technologies. His work has been instrumental in enhancing the capabilities of radiation detection systems.
Collaborations
Throughout his career, Tuomas has collaborated with talented professionals, including Jukka Hassi and Vesa Kulkki. These collaborations have contributed to the advancement of innovative solutions in the field.
Conclusion
Tuomas Pylkkaenen's contributions to radiation detection technology through his patent and work at Hitachi High-Tech Analytical Science Finland Oy highlight his role as a key innovator in the industry. His advancements continue to influence the development of more effective radiation detection systems.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile