This inventor holds 1 USPTO granted patent. Top assignee: Nan Ya Technology Corporation. Active years: 2005.
Company Filing History:
Years Active: 2005
Title: The Innovative Contributions of Tun Yuan Lo
Introduction
Tun Yuan Lo is a notable inventor based in Zhongli, Taiwan. He has made significant contributions to the field of technology, particularly in the area of wafer detection. His innovative approach has led to the development of a unique apparatus that enhances the accuracy of flaw detection in wafers.
Latest Patents
One of Tun Yuan Lo's key patents is titled "Method and apparatus for detecting wafer flaw." This invention provides an apparatus designed to detect flaws in a wafer. The apparatus features a detection platform that holds the wafer, a cross-bar ultrasonic detection device positioned above the platform to emit and receive ultrasonic waves reflected by the wafer, and a microprocessor that processes the reflected ultrasonic signals and transmits the data to a monitor. This invention is crucial for improving the quality control processes in semiconductor manufacturing.
Career Highlights
Tun Yuan Lo is currently employed at Nan Ya Technology Corporation, a leading company in the technology sector. His work at Nan Ya Technology has allowed him to apply his innovative ideas and contribute to advancements in wafer technology. His dedication to research and development has positioned him as a valuable asset in his field.
Collaborations
Throughout his career, Tun Yuan Lo has collaborated with esteemed colleagues such as Chih-Kun Chen and Yao-Hsiung Kung. These collaborations have fostered a creative environment that encourages the exchange of ideas and the development of groundbreaking technologies.
Conclusion
Tun Yuan Lo's contributions to the field of wafer detection exemplify the impact of innovation in technology. His patent and work at Nan Ya Technology Corporation highlight his commitment to advancing the industry. His achievements serve as an inspiration for future inventors and innovators.