Akiruno, Japan

Tsuyoshi Endoh

This inventor holds 1 USPTO granted patent. Top assignee: Casio Computer Co., Ltd.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsuyoshi Endoh. Retrieved from https://idiyas.com/inventor/tsuyoshi-endoh-vdhwpxe2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Tsuyoshi Endoh: Innovator in Imaging Technology

Introduction

Tsuyoshi Endoh is a notable inventor based in Akiruno, Japan. He has made significant contributions to the field of imaging technology, particularly through his innovative patent.

Latest Patents

Endoh holds a patent for an "Imaging apparatus, imaging method, and computer-readable storage medium storing program therein." This imaging apparatus is equipped with a voltage control section that individually manages the focus distance of a lens based on multiple pieces of management information. The apparatus switches the focus distance during imaging at predetermined intervals, ensuring precise control in accordance with the focus distance indicated by each piece of management information.

Career Highlights

Tsuyoshi Endoh is associated with Casio Computer Co., Ltd., where he has been instrumental in developing advanced imaging solutions. His work has contributed to enhancing the functionality and efficiency of imaging devices.

Collaborations

Endoh has collaborated with notable colleagues, including Yasuaki Ogawa and Keiichi Tanioka, to further advance the technology in their field.

Conclusion

Tsuyoshi Endoh's innovative work in imaging technology exemplifies the impact of dedicated inventors in shaping modern devices. His contributions continue to influence the industry and inspire future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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