Tokyo, Japan

Tsutomu Shindo

This inventor holds 1 USPTO granted patent. Top assignee: Ohkura Electric Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsutomu Shindo. Retrieved from https://idiyas.com/inventor/tsutomu-shindo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 9(Granted Patents)


Company Filing History:


Years Active: 2000

Loading Chart...
1 patent (USPTO):Explore Patents

Title: The Innovations of Tsutomu Shindo

Introduction

Tsutomu Shindo is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of technology, particularly in the area of temperature measurement. His work has led to the development of innovative solutions that enhance the functionality of electronic devices.

Latest Patents

Tsutomu Shindo holds a patent for an external connection mechanism of temperature-measuring type for printed circuits. This invention showcases his expertise in creating practical applications that improve the efficiency and accuracy of temperature measurements in various devices. He has 1 patent to his name, reflecting his commitment to innovation.

Career Highlights

Shindo is currently employed at Ohkura Electric Co., Ltd., where he continues to work on advancing technology in the electronics sector. His role at the company allows him to collaborate with other talented professionals and contribute to groundbreaking projects.

Collaborations

One of his notable coworkers is Kenjiro Hamada. Together, they have worked on various projects that aim to push the boundaries of technology and improve existing systems.

Conclusion

Tsutomu Shindo's contributions to the field of technology through his innovative patents and collaborative efforts highlight his importance as an inventor. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…