Otawara, Japan

Tsutomu Naitoh

This inventor holds 1 USPTO granted patent. Top assignee: Eiken Kagaku Kabushiki Kaish. Active years: 1999.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsutomu Naitoh. Retrieved from https://idiyas.com/inventor/tsutomu-naitoh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1999

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1 patent (USPTO):Explore Patents

Title: Tsutomu Naitoh: Innovator in Cell Detection Technology

Introduction

Tsutomu Naitoh is a notable inventor based in Otawara, Japan. He has made significant contributions to the field of cell detection technology. His innovative approach has led to the development of a patented method that enhances the accuracy and efficiency of cell detection processes.

Latest Patents

Tsutomu Naitoh holds a patent for a "Method of Cell Detection." This invention showcases his expertise and commitment to advancing scientific research and technology. The patent reflects his dedication to improving methodologies in the field.

Career Highlights

Naitoh is currently employed at Eiken Kagaku Kabushiki Kaisha, a company known for its contributions to medical diagnostics and biotechnology. His work at Eiken has allowed him to focus on developing innovative solutions that address critical challenges in cell detection.

Collaborations

Throughout his career, Tsutomu Naitoh has collaborated with talented individuals such as Toshihiro Yonekawa and Kiyoshi Miyai. These partnerships have fostered a creative environment that encourages the exchange of ideas and expertise.

Conclusion

Tsutomu Naitoh's contributions to cell detection technology exemplify the impact of innovation in the scientific community. His work continues to inspire advancements in medical diagnostics and research methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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