Taipei, Taiwan

Tsung-Li Fang

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Moxa Inc.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsung-Li Fang. Retrieved from https://idiyas.com/inventor/tsung-li-fang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 9.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Tsung-Li Fang: Innovator in Secure Boot Technology

Introduction

Tsung-Li Fang is a notable inventor based in Taipei, Taiwan. He has made significant contributions to the field of computer security, particularly in the area of secure boot technology. His innovative approach addresses critical vulnerabilities in computer systems.

Latest Patents

Tsung-Li Fang holds a patent for a "Computer system for failing a secure boot in a case tampering event." This invention includes a microcontroller unit (MCU) and a trusted platform module (TPM) that generates random bytes for secure booting. The system is designed to detect case tampering events through sensors and triggers the deletion of sensitive data to protect the integrity of the system.

Career Highlights

Fang is currently employed at Moxa Inc., where he continues to develop cutting-edge technologies. His work focuses on enhancing the security features of computer systems, ensuring that they remain resilient against tampering and unauthorized access.

Collaborations

Some of his notable coworkers include Chia-Te Chou and Tsung-Yi Lin, who collaborate with him on various projects at Moxa Inc. Their combined expertise contributes to the advancement of secure technology solutions.

Conclusion

Tsung-Li Fang's innovative work in secure boot technology exemplifies the importance of safeguarding computer systems against tampering. His contributions are vital in the ongoing effort to enhance cybersecurity measures in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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