Hachioji, Japan

Tsukasa Sato

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsukasa Sato. Retrieved from https://idiyas.com/inventor/tsukasa-sato-oxc7qkee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 31(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Tsukasa Sato

Introduction

Tsukasa Sato is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of integrated logic circuits. His innovative approach has led to the development of a unique method for diagnosing these circuits.

Latest Patents

Tsukasa Sato holds a patent for a "Method of diagnosing integrated logic circuit." This method involves supplying a test signal to the logic circuit and detecting input and output signals from function blocks using contactless probing devices. The process includes simulating normal logic operations and comparing detected and simulated output signals to determine the functionality of the circuit. If abnormalities are found, the method allows for tracing the issue back to faulty function elements through repeated detection and comparison.

Career Highlights

Sato is currently employed at Hitachi, Ltd., where he continues to innovate and contribute to advancements in technology. His work has been instrumental in enhancing the reliability and efficiency of integrated circuits.

Collaborations

Tsukasa Sato has collaborated with notable colleagues such as Noboru Yamaguchi and Hideo Nakamura. Their combined expertise has fostered a productive environment for innovation and development.

Conclusion

Tsukasa Sato's contributions to the field of integrated logic circuits exemplify the spirit of innovation. His patented method showcases his ability to solve complex problems in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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