Company Filing History:
Years Active: 2012-2024
Title: Tsukasa Nittono: Innovator in Measurement Systems and Microscopy
Introduction
Tsukasa Nittono is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the fields of measurement systems and microscopy. With a total of 2 patents, his work has advanced the technology used in optical measurements and imaging.
Latest Patents
Nittono's latest patents include a measurement system and a confocal microscope. The measurement system features an optical measurement instrument designed to measure the surface of a specimen. It includes a control apparatus that manages the measurement instrument, utilizing non-transitory computer-readable media and processors to execute specific operations. This system allows for repetitive measurements of the specimen's surface without altering the settings, while also evaluating the appropriateness of those settings based on comparative analysis of measurement data.
The confocal microscope developed by Nittono incorporates an objective lens that converges light from a source onto a sample. It features a scanning mechanism for relative scanning and multiple confocal diaphragm apertures with varying diameters. The microscope is equipped with several photodetectors that measure light intensity, and a processing unit that combines these signals after applying appropriate weights.
Career Highlights
Throughout his career, Tsukasa Nittono has worked with notable companies such as Olympus Corporation and Evident Corporation. His experience in these organizations has contributed to his expertise in optical measurement technologies and microscopy.
Collaborations
Nittono has collaborated with talented individuals in his field, including Akihiro Kitahara and Shinsuke Kaneki. These partnerships have likely enhanced his innovative capabilities and led to the development of advanced technologies.
Conclusion
Tsukasa Nittono is a distinguished inventor whose work in measurement systems and microscopy has made a lasting impact on the industry. His patents reflect a commitment to advancing technology and improving measurement techniques.