The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 29, 2012

Filed:

Dec. 23, 2008
Applicants:

Akihiro Kitahara, Tokyo, JP;

Tsukasa Nittono, Tokyo, JP;

Shinsuke Kaneki, Tokyo, JP;

Inventors:

Akihiro Kitahara, Tokyo, JP;

Tsukasa Nittono, Tokyo, JP;

Shinsuke Kaneki, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 7/04 (2006.01); G02B 27/40 (2006.01); G02B 27/64 (2006.01);
U.S. Cl.
CPC ...
Abstract

A confocal microscope includes an objective lens for converging light which is emitted from a light source to a sample, a scanning mechanism for relatively scanning the sample with the light converged to the sample, and a plurality of confocal diaphragm apertures that are arranged at positions optically conjugate to the light-gathering position of the objective lens and have different diaphragm diameters. The confocal microscope further includes a plurality of photodetectors for detecting the intensities of lights respectively transmitting through the confocal diaphragm apertures, and a weighting/combining arithmetic processing unit for combining signals output from the photodetectors after weighting the signals.


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