Stormville, NY, United States of America

Tsong Lin Leo Tai


Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):

Title: Innovations by Tsong Lin Leo Tai in Electromigration Resistance

Introduction

Tsong Lin Leo Tai is a notable inventor based in Stormville, NY, USA. He has made significant contributions to the field of materials science, particularly in the area of copper interconnect structures used in semiconductor technology. With one patent to his name, he continues to influence the industry through his innovative solutions.

Latest Patents

Tsong Lin Leo Tai holds a patent for a "Copper interconnect structure and its formation." This invention features a structure that boasts improved electromigration resistance, which is crucial for the performance and reliability of electronic devices. The design involves a bulk interconnect that incorporates a dual layer cap along with a dielectric capping layer. The dual layer cap is comprised of a bottom metallic portion and a top metal oxide portion, with manganese oxide (MnO) or manganese silicate (MnSiO) typically featured as the metal oxide layer. The integrity of the interconnect is further enhanced by doping it with impurities like manganese, which helps create lattice defects that facilitate improved impurity migration. This innovative approach is set to advance the durability and longevity of electronic components.

Career Highlights

Tsong Lin Leo Tai currently works at the International Business Machines Corporation (IBM), a leading entity in the tech industry known for its continuous pursuit of innovation. Throughout his career, he has focused on developing solutions that address the challenges of modern electronics, particularly in optimizing interconnect technologies.

Collaborations

In his role at IBM, Tai has collaborated with esteemed colleagues, including Daniel C Edelstein and Takeshi Nogami. Together, these innovators work on projects that push the boundaries of technology, driving forward advancements in semiconductor fabrication and materials engineering.

Conclusion

Tsong Lin Leo Tai's contributions to the field of electromigration resistance in copper interconnect structures represent a significant step forward in semiconductor technology. His patent underscores his dedication to innovation and his impact within the industry. As technologies continue to evolve, the work of inventors like Tai will be essential in shaping the future of electronics and ensuring the reliability of devices used in everyday life.

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