Taipei, Taiwan

Tse-Wei Wu

This inventor holds 1 USPTO granted patent. Top assignee: Realtek Semiconductor Inc.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tse-Wei Wu. Retrieved from https://idiyas.com/inventor/tse-wei-wu-nr5vel20

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Tse-Wei Wu and Electronic Device Testing Innovation.

Introduction

Tse-Wei Wu is an inventor based in Taipei, Taiwan. His work includes a patented method and apparatus for generating test databases for electronic devices. He is associated with Realtek Semiconductor Inc.

Latest Patents

Wu is credited with 1 patent: “Electronic Device Test Database Generating Method and Electronic Device Test Database Generating Apparatus.” The invention uses a target device’s cell layout information to identify possible defect locations. It then tests the device based on those locations and uses the results to generate an electronic device test database.

Career Highlights

Wu’s patent describes a structured approach to electronic device testing. By deriving potential defect locations from cell layout information, the method can guide testing and organize its results in a database.

Collaborations

Wu’s listed coworkers include Po-Lin Chen and Ying-Yen Chen.

Conclusion

Tse-Wei Wu’s patent focuses on using layout-based defect analysis and test results to generate databases that support electronic device testing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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