Keelung, Taiwan

Tsai-Sheng Kao

This inventor holds 1 USPTO granted patent. Top assignee: Keystone Semiconductor Inc.. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tsai-Sheng Kao. Retrieved from https://idiyas.com/inventor/tsai-sheng-kao

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Tsai-Sheng Kao: Innovator in Equal Error Protection Profiles

Introduction

Tsai-Sheng Kao is a notable inventor based in Keelung, Taiwan. He has made significant contributions to the field of data decoding through his innovative methods. His work focuses on enhancing the efficiency of data protection mechanisms.

Latest Patents

Tsai-Sheng Kao holds a patent for a "Method for calculating equal error protection profiles." This method involves calculating equal error protection (EEP) profiles using a profile function related to sub-channel sizes. The invention allows for rapid decoding of data by utilizing a reference table that correlates protection levels with sub-channel sizes. This approach minimizes the computational resources required, achieving cost-effectiveness and efficiency.

Career Highlights

Kao is associated with Keystone Semiconductor Inc., where he applies his expertise in semiconductor technology. His innovative methods have the potential to improve data transmission reliability in various applications.

Collaborations

Kao collaborates with Chung-Jung Huang, contributing to advancements in their field through shared knowledge and expertise.

Conclusion

Tsai-Sheng Kao's work in developing methods for calculating equal error protection profiles showcases his innovative spirit and dedication to improving data protection technologies. His contributions are valuable to the semiconductor industry and beyond.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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