This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignees: Ykk Ap Inc., Ykk Corporation. Active years: 2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2012
Title: Toshitaka Wakabayashi: Innovator in Visual Inspection Technology
Introduction
Toshitaka Wakabayashi is a notable inventor based in Toyama, Japan. He has made significant contributions to the field of visual inspection technology, particularly in the quality control of aluminum extruded products. His innovative approach has led to the development of a unique apparatus that enhances the detection of surface defects.
Latest Patents
Wakabayashi holds 1 patent for an article visual inspection apparatus. This apparatus is designed to detect inferior surface conditions that may render an article unusable. It inspects external defects such as streaks, dice marks, and rough surfaces on aluminum extruded shapes. The system includes an imaging device for capturing the surface image and an image processing device that evaluates the quality based on a set of reference values. The comprehensive judgment of whether to accept or reject an article is achieved through weighted evaluations from multiple image processing units.
Career Highlights
Throughout his career, Wakabayashi has worked with prominent companies, including YKK Ap Inc. and YKK Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in product quality assurance.
Collaborations
Wakabayashi has collaborated with notable colleagues such as Hisayuki Kato and Mitsuyasu Fukusawa. Their combined expertise has fostered innovation in the field of visual inspection technology.
Conclusion
Toshitaka Wakabayashi's contributions to visual inspection technology exemplify the impact of innovative thinking in quality control processes. His patent for an article visual inspection apparatus showcases his commitment to enhancing product standards in the manufacturing industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile