Chiba, Japan

Toshirou Mukai

This inventor holds 1 USPTO granted patent. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshirou Mukai. Retrieved from https://idiyas.com/inventor/toshirou-mukai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2010

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1 patent (USPTO):Explore Patents

Title: The Innovations of Toshirou Mukai

Introduction

Toshirou Mukai is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of data recording technology. His innovative approach has led to the development of a unique device that enhances the way time-series data is recorded.

Latest Patents

Mukai holds a patent for a "Time-series data recording device and time-series data recording method." This invention allows for the retroactive recording of time-series data from a point before the actual recording begins. The device includes a control unit with characteristic detecting means, a temporary storage unit, and recording units that work together to capture data efficiently.

Career Highlights

Mukai is associated with Sharp Kabushiki Kaisha Corporation, a leading technology company known for its advancements in electronics and data solutions. His work at Sharp has allowed him to focus on innovative projects that push the boundaries of technology.

Collaborations

Mukai collaborates with Keiko Watanuki, a fellow innovator, to further enhance their research and development efforts. Their teamwork exemplifies the spirit of innovation and collaboration in the tech industry.

Conclusion

Toshirou Mukai's contributions to time-series data recording technology highlight his role as a significant inventor in the field. His patent reflects a forward-thinking approach that can impact various applications in data management.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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