Tokyo, Japan

Toshiro Mori


 

Average Co-Inventor Count = 2.9

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016-2020

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2 patents (USPTO):Explore Patents

Title: Toshiro Mori: Innovator in Prober Technology

Introduction

Toshiro Mori is a distinguished inventor based in Tokyo, Japan. He has made significant contributions to the field of prober technology, holding a total of 2 patents. His innovative designs focus on enhancing the efficiency and safety of wafer inspection processes.

Latest Patents

Mori's latest patents include a prober and a prober operation method. The prober is designed to prevent collisions between a probe and a probe position detecting camera. It features a probe position detecting camera that aligns the probe with the electrode of a wafer. Additionally, it includes a probe height detector that measures the probe's height from a reference plane. This design is complemented by a height adjusting mechanism that modifies the camera's height based on the probe height detection results.

The second patent describes a prober that consists of a conductive wafer chuck and a movement rotation mechanism. This prober allows for the movement and rotation of the wafer chuck while maintaining electrical connections through a wiring member. The design ensures that the back-surface electrode of a chip is connected to a tester via the wafer chuck, enhancing the overall functionality of the prober.

Career Highlights

Toshiro Mori is currently employed at Tokyo Seimitsu Co., Ltd., where he continues to develop innovative solutions in the field of semiconductor testing. His work has significantly impacted the efficiency of wafer inspection processes, making him a key figure in the industry.

Collaborations

Mori collaborates with notable colleagues, including Konosuke Murakami and Yuji Shigesawa. Their combined expertise contributes to the advancement of prober technology and the development of new innovations.

Conclusion

Toshiro Mori's contributions to prober technology exemplify his commitment to innovation in the semiconductor industry. His patents reflect a deep understanding of the challenges in wafer inspection and a dedication to improving the processes involved.

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