Kanagawa, Japan

Toshio Ogawa

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi-Kokusai Electric Inc.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Ogawa. Retrieved from https://idiyas.com/inventor/toshio-ogawa-kxlu01a1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Toshio Ogawa: Innovator in Article Management Systems

Introduction

Toshio Ogawa is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of article management systems, showcasing his innovative spirit and technical expertise.

Latest Patents

Ogawa holds a patent for an "Enhanced article management system and method." This system includes an exit monitoring device, a storage shelf unit, and a non-contact ID tag. Each component is optionally equipped with a detection enhancing device to improve the transmission and reception of signals. The detection enhancing device may consist of a loop conductive line or an additional loop antenna, which enhances the overall functionality of the system.

Career Highlights

Toshio Ogawa is associated with Hitachi Kokusai Electric Inc., where he has been instrumental in developing advanced technologies. His work has contributed to the efficiency and effectiveness of article management systems, making a lasting impact in the industry.

Collaborations

Ogawa has collaborated with notable colleagues, including Keisuke Igarashi and Kazuo Akaike. Their combined efforts have fostered innovation and progress within their projects.

Conclusion

Toshio Ogawa's contributions to article management systems exemplify his dedication to innovation and technology. His patent and collaborations highlight his role as a key figure in advancing this field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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