Iizuka, Japan

Toshio Murai

This inventor holds 1 USPTO granted patent. Top assignee: Kyushu Hitachi Maxell, Ltd.. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshio Murai. Retrieved from https://idiyas.com/inventor/toshio-murai-1bjfzvk6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 20(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: The Innovations of Toshio Murai

Introduction

Toshio Murai is a notable inventor based in Iizuka, Japan. He has made significant contributions to the field of temperature measurement technology. His innovative approach has led to the development of a unique temperature measurement device.

Latest Patents

Murai holds 1 patent for his temperature measurement device. This device utilizes output signals from a temperature measuring sensor, which are stored in a recording element. The device displays these signals when a judging element detects that a manipulatable switch is closed. Temperature measurement begins, including displaying the temperature, when the judging element detects that the switch is opened after it has been closed.

Career Highlights

Murai is currently employed at Kyushu Hitachi Maxell, Ltd., where he continues to innovate and develop new technologies. His work has been instrumental in advancing temperature measurement techniques.

Collaborations

Murai has collaborated with notable coworkers such as Junzo Murata and Masahiro Hosono. Their combined expertise has contributed to the success of various projects within the company.

Conclusion

Toshio Murai's contributions to temperature measurement technology exemplify the spirit of innovation. His work at Kyushu Hitachi Maxell, Ltd. continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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