Yamaguchi, Japan

Toshimitsu Nishimura

This inventor holds 1 USPTO granted patent. Top assignee: Kabushiki Kaisha Kobe Seiko Sho. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshimitsu Nishimura. Retrieved from https://idiyas.com/inventor/toshimitsu-nishimura

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Toshimitsu Nishimura: Innovator in Pipe Leak Detection

Introduction

Toshimitsu Nishimura is a notable inventor based in Yamaguchi, Japan. He has made significant contributions to the field of leak detection technology. His innovative approach has led to the development of a unique pneumatic pipe leak tester.

Latest Patents

Nishimura holds a patent for a pipe leak detector. This invention includes a compressed air source and multiple conduits that connect to the pipe being examined. The system features on-off valves, electromagnetic valves, and a pressure transducer that signals when a leak is detected. The design allows for effective sealing of compressed air in the conduits, ensuring accurate testing of pipes.

Career Highlights

Toshimitsu Nishimura is associated with Kabushiki Kaisha Kobe Seiko Sho, where he has applied his expertise in developing innovative solutions. His work has been instrumental in enhancing the reliability of pipe leak detection methods.

Collaborations

Nishimura has collaborated with Noritsugu Fujii, contributing to advancements in their field. Their partnership has fostered innovation and improved the effectiveness of their projects.

Conclusion

Toshimitsu Nishimura's contributions to pipe leak detection technology exemplify his commitment to innovation. His patent and collaborative efforts continue to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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