Tokyo, Japan

Toshiki Ohinata

This inventor holds 1 USPTO granted patent. Top assignee: Konica Minolta Laboratory U.s.a., Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiki Ohinata. Retrieved from https://idiyas.com/inventor/toshiki-ohinata

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Toshiki Ohinata

Introduction

Toshiki Ohinata is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of wearable technology. His innovative approach has led to the development of a unique method and apparatus for interactive user interfaces.

Latest Patents

Toshiki Ohinata holds a patent for a "Method and apparatus for interactive user interface with wearable device." This invention involves a sophisticated method for recognizing objects through the emission of arranged patterns of infrared rays. The system captures both infrared and RGB images, allowing for precise mapping and interaction with the projection region.

Career Highlights

Ohinata is currently associated with Konica Minolta Laboratory U.S.A., Inc. His work focuses on enhancing user experiences through advanced technology. He has demonstrated a commitment to innovation and excellence in his field.

Collaborations

Toshiki Ohinata has collaborated with notable colleagues, including Yongmian Zhang and Jingwen Zhu. Their combined expertise contributes to the advancement of technology in wearable devices.

Conclusion

Toshiki Ohinata's contributions to the field of wearable technology exemplify the spirit of innovation. His patent reflects a forward-thinking approach that enhances user interaction with devices. His work continues to inspire advancements in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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