Mizuho, Japan

Toshikazu Ohno

This inventor holds 1 USPTO granted patent. Top assignee: Sanyo Electric Co., Ltd.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshikazu Ohno. Retrieved from https://idiyas.com/inventor/toshikazu-ohno-qd8apvr5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: The Innovations of Toshikazu Ohno

Introduction

Toshikazu Ohno is a notable inventor based in Mizuho, Japan. He has made significant contributions to the field of image technology, particularly through his innovative patent. His work reflects a deep understanding of the complexities involved in image pickup apparatuses.

Latest Patents

Toshikazu Ohno holds a patent for an image pickup apparatus. This apparatus includes a plurality of pixels and increasing portions that enhance the charges stored in the pixels. The frequency of charge increases is controlled for each group of at least one pixel, responding to the luminance of light incident upon the pixels. This innovation showcases his ability to merge technology with practical applications in imaging.

Career Highlights

Ohno is associated with Sanyo Electric Co., Ltd., a company known for its advancements in electronics and technology. His role there has allowed him to work on cutting-edge projects that push the boundaries of image processing and technology.

Collaborations

Toshikazu Ohno has collaborated with Tatsushi Ohyama, a fellow innovator. Their partnership has likely contributed to the development of advanced technologies in their field.

Conclusion

Toshikazu Ohno's contributions to the field of image technology through his patent and work at Sanyo Electric Co., Ltd. highlight his innovative spirit and dedication to advancing imaging technology. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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