Urawa, Japan

Toshikatsu Takedomi

This inventor holds 1 USPTO granted patent. Top assignees: Akai Electric Co., Ltd., Alpine Electronics, Inc., Mitsubishi Denki Kabushiki Kaisha. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshikatsu Takedomi. Retrieved from https://idiyas.com/inventor/toshikatsu-takedomi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: The Innovations of Toshikatsu Takedomi

Introduction

Toshikatsu Takedomi is a notable inventor based in Urawa, Japan. He has made significant contributions to the field of error correction technology. His innovative work has led to the development of a unique error correcting and controlling system.

Latest Patents

Toshikatsu Takedomi holds a patent for an error correcting and controlling system. This system forms syndromes for a set of reproduced, sampled signal words and error correcting words. It utilizes a CRC check to determine error positions and generates control signals for concealing operations when errors are detected.

Career Highlights

Throughout his career, Takedomi has worked with prominent companies such as Mitsubishi Electric Corporation and Akai Electric Co., Ltd. His experience in these organizations has allowed him to refine his skills and contribute to various technological advancements.

Collaborations

Toshikatsu Takedomi has collaborated with notable individuals in the industry, including Ken Onishi and Masayuki Ishida. These collaborations have further enhanced his work and innovation in the field.

Conclusion

Toshikatsu Takedomi's contributions to error correction technology exemplify his innovative spirit and dedication to advancing the field. His patent and career achievements reflect his significant impact on technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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