Toshihiro Kikkawa

Title: The Innovations of Toshihiro Kikkawa

Introduction

Toshihiro Kikkawa is a notable inventor based in Yokohama, Kanagawa, Japan. He has made significant contributions to the field of optical inspection technology. His work has led to the development of innovative methods that enhance the accuracy and efficiency of optical inspections.

Latest Patents

Kikkawa holds a patent for an "Optical inspection method, non-transitory storage medium storing optical inspection program, processing device, and optical inspection apparatus." This patent describes a method for assessing the surface state of a subject by acquiring and discriminating color vectors corresponding to wavelength spectra. The method utilizes optical imaging techniques to selectively allow various wavelength spectra to pass from the subject's surface, enabling precise discrimination based on the direction of the color vector in a multi-dimensional color coordinate system. He has 1 patent to his name.

Career Highlights

Throughout his career, Kikkawa has worked with prominent companies, including Toshiba Corporation and Toshiba Digital Solutions Corporation. His experience in these organizations has allowed him to refine his skills and contribute to groundbreaking advancements in optical inspection technologies.

Collaborations

Kikkawa has collaborated with esteemed colleagues such as Hiroshi Ohno and Hiroya Kano. These partnerships have fostered a creative environment that has led to innovative solutions in the field.

Conclusion

Toshihiro Kikkawa's contributions to optical inspection technology exemplify the impact of innovative thinking in engineering. His patent and collaborations highlight the importance of teamwork in advancing technological frontiers.