The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 07, 2025
Filed:
Feb. 25, 2022
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Digital Solutions Corporation, Kawasaki-shi Kanagawa, JP;
Hiroshi Ohno, Tokyo, JP;
Hiroya Kano, Kawasaki Kanagawa, JP;
Takahiro Kamikawa, Tokyo, JP;
Hideaki Okano, Yokohama Kanagawa, JP;
Akifumi Ohno, Tokyo, JP;
Akio Kawasaki, Kawasaki Kanagawa, JP;
Toshihiro Kikkawa, Yokohama Kanagawa, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Toshiba Digital Solutions Corporation, Kawasaki, JP;
Abstract
According to the embodiment, an optical inspection method for a surface state of a subject includes acquiring and discriminating. The acquiring includes acquiring a color vector of a color corresponding to a wavelength spectrum in a color coordinate system of n dimensions (n is a natural number equal to or larger than 1), which is equal to or smaller than a number of a plurality of color channels of pixels of an image sensor, with optical imaging using a wavelength spectrum selection portion that selectively allows a plurality of wavelength spectra different from one another from a surface of the subject to pass. The discriminating includes discriminating the surface state of the subject based on a direction of the color vector in the color coordinate system.