This inventor holds 3 USPTO granted patents and 1 EPO patent. Top assignee: Aisin Seiki Kabushiki Kaisha. Active years: 2001-2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Aichi-ken, JP (2001)
- Nishikamo-gun, JP (2011)
- Miyoshi, JP (2013)
Company Filing History:
Years Active: 2001-2013
Title: Innovations by Toshihiko Yoshikawa
Introduction
Toshihiko Yoshikawa is a notable inventor based in Miyoshi, Japan. He has made significant contributions to the field of surface inspection technology, holding a total of 3 patents. His work focuses on developing advanced devices that enhance the accuracy and efficiency of surface profile inspections.
Latest Patents
Yoshikawa's latest patents include a surface profile inspection device and a concave-convex surface inspection apparatus. The surface profile inspection device utilizes a laser beam emitted from a semiconductor laser to create a sheet of light that is directed at the object being measured. This device features an image capturing unit that records the object's image and a configuration data generating unit that extracts light section lines from the captured image data to produce surface profile data. The semiconductor laser is strategically positioned to optimize the measurement process.
The concave-convex surface inspection apparatus employs a slit light source unit that illuminates the concave-convex surface of an object. It includes an image-taking unit that captures images of the illuminated surface, allowing for the evaluation of its three-dimensional shape. This apparatus is designed to enhance the focusing range of the concave-convex surface, ensuring precise measurements.
Career Highlights
Yoshikawa is currently associated with Aisin Seiki Kabushiki Kaisha, a company known for its innovative automotive components and technologies. His work at Aisin Seiki has been instrumental in advancing inspection technologies that are crucial for quality control in manufacturing processes.
Collaborations
Throughout his career, Yoshikawa has collaborated with esteemed colleagues such as Masataka Toda and Masaru Hisanaga. These collaborations have fostered a creative environment that has led to the development of cutting-edge technologies in the field of surface inspection.
Conclusion
Toshihiko Yoshikawa's contributions to surface inspection technology through his innovative patents and collaborations highlight his significant role in advancing this field. His work continues to impact the quality and efficiency of manufacturing processes in various industries.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile