Komaki, Japan

Toshihiko Inoue

This inventor holds 1 USPTO granted patent. Top assignee: Yamazaki Machinery Works, Ltd.. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshihiko Inoue. Retrieved from https://idiyas.com/inventor/toshihiko-inoue-ujcbjft4

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Toshihiko Inoue: Innovator in Machining Technology

Introduction

Toshihiko Inoue is a notable inventor based in Komaki, Japan. He has made significant contributions to the field of machining technology, particularly through his innovative patent that enhances the precision of lathe operations.

Latest Patents

Inoue holds a patent for a "Method and apparatus for searching for a fiducial point of machining." This invention relates to a method and apparatus designed to identify a fiducial point of machining concerning the C-axis in a lathe. The technology allows for machining by C-axis control based on the C-axis origin. It involves measuring angles between the C-axis origin and points of measurement on a workpiece, enabling the detection of the fiducial point with high accuracy.

Career Highlights

Toshihiko Inoue is associated with Yamazaki Machinery Works, Ltd., where he has applied his expertise in machining technology. His work has contributed to advancements in the efficiency and accuracy of machining processes.

Collaborations

Inoue has collaborated with notable colleagues, including Kimimasa Ishiguro and Akimitsu Nagae. These partnerships have fostered innovation and development within the field of machining technology.

Conclusion

Toshihiko Inoue's contributions to machining technology through his patent demonstrate his commitment to innovation and precision in manufacturing processes. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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