Tokyo, Japan

Toshiharu Ikeda

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hakusan Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiharu Ikeda. Retrieved from https://idiyas.com/inventor/toshiharu-ikeda-9bidtxc1

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Toshiharu Ikeda: Innovator in Optical Fiber Technology

Introduction

Toshiharu Ikeda is a prominent inventor based in Tokyo, Japan. He is known for his significant contributions to the field of optical fiber technology. His innovative work has led to the development of advanced measurement systems that utilize optical fibers.

Latest Patents

Ikeda holds a patent for an "Optical fiber sensor utilizing Faraday rotator mirrors and measuring system using the same." This invention involves a sophisticated optical fiber sensor where laser pulses from a laser source are divided into a reference path and a measurement path. The system employs Faraday rotator mirrors (FRMs) to enhance the accuracy of measurements. The reflected light from both paths is interfered at an optical coupler, allowing for precise phase measurements.

Career Highlights

Toshiharu Ikeda is associated with Hakusan Corporation, where he has made significant strides in optical technology. His work has not only advanced the capabilities of optical sensors but has also contributed to various applications in measurement systems.

Collaborations

Ikeda has collaborated with notable colleagues, including Tsutomu Yamate and Masashi Saijo. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion

Toshiharu Ikeda's contributions to optical fiber technology exemplify the impact of innovative thinking in engineering. His patent and collaborative efforts continue to influence advancements in measurement systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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