Kanagawa, Japan

Toshiaki Ueno

This inventor holds 1 USPTO granted patent. Top assignee: Agilent Technologies, Inc.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiaki Ueno. Retrieved from https://idiyas.com/inventor/toshiaki-ueno-x1gl625a

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Toshiaki Ueno: Innovator in Display Technology

Introduction

Toshiaki Ueno is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of display technology, particularly in the development of testing apparatuses for display substrates.

Latest Patents

Ueno holds a patent for a "Probe device and display substrate testing apparatus using same." This invention involves generating a plasma with a specific density between a test electrode and an electrode on a display substrate that comprises a TFT array, which is the circuit under test. The technology allows for the transmission of a test signal between the electrode and the test electrode via the plasma. This innovative approach enables the measurement of the electrical characteristics of the TFT array formed on the display substrate in a non-contact manner.

Career Highlights

Toshiaki Ueno is currently employed at Agilent Technologies, Inc., where he continues to work on advancements in display technology. His expertise and innovative mindset have positioned him as a valuable asset in his field.

Collaborations

Ueno collaborates with Norihide Yamada, contributing to the development of cutting-edge technologies in their domain.

Conclusion

Toshiaki Ueno's work in display technology exemplifies the impact of innovation on modern electronics. His patent and ongoing contributions highlight the importance of non-contact testing methods in enhancing the performance of display substrates.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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