Hirakata, Japan

Toshiaki Hayashida

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent. Top assignee: Sanyo Electric Co., Ltd.. Active years: 1991.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toshiaki Hayashida. Retrieved from https://idiyas.com/inventor/toshiaki-hayashida

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 87(Granted Patents)


Company Filing History:


Years Active: 1991

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1 patent (USPTO):Explore Patents

Title: Toshiaki Hayashida: Innovator in Image Display Technology

Introduction

Toshiaki Hayashida is a notable inventor based in Hirakata, Japan. He has made significant contributions to the field of image display technology. His work has led to advancements that enhance the performance and efficiency of display apparatuses.

Latest Patents

Hayashida holds a patent for a "Driving circuit for an image display apparatus with improved yield." This innovation reflects his commitment to improving the quality and reliability of image display technologies. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Toshiaki Hayashida is associated with Sanyo Electric Co., Ltd., a company known for its innovations in electronics and technology. His role at Sanyo has allowed him to work on cutting-edge projects that push the boundaries of image display systems.

Collaborations

Throughout his career, Hayashida has collaborated with talented individuals such as Hajime Takesada and Mitsuhiro Yamasaki. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Toshiaki Hayashida's contributions to image display technology exemplify the impact of dedicated inventors in advancing modern electronics. His work continues to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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