Kodaira, Japan

Toru Takeda

This inventor holds 1 USPTO granted patent. Top assignees: Hitachi, Ltd., Nippon T&t Corp.. Active years: 1989.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Toru Takeda. Retrieved from https://idiyas.com/inventor/toru-takeda-vye9mnce

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 49(Granted Patents)


Company Filing History:


Years Active: 1989

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1 patent (USPTO):Explore Patents

Title: The Innovative Mind of Toru Takeda

Introduction

Toru Takeda is a notable inventor based in Kodaira, Japan. He has made significant contributions to the field of information recording technology. His innovative approach has led to the development of a unique patent that addresses issues related to defective data recording areas.

Latest Patents

Toru Takeda holds a patent for an "Information recording control system reusing a defective area." This invention provides a method for controlling information recording in an apparatus that includes a rewritable information record medium. The system effectively manages data recording blocks and alternative areas for defective blocks, ensuring data integrity and efficient rewriting processes.

Career Highlights

Throughout his career, Takeda has worked with prominent companies such as Hitachi, Ltd. and Nippon T&T Corporation. His experience in these organizations has allowed him to refine his skills and contribute to advancements in technology.

Collaborations

Toru Takeda has collaborated with notable coworkers, including Kenji Tokumitsu and Takashi Doi. Their combined expertise has fostered an environment of innovation and creativity in their projects.

Conclusion

Toru Takeda's contributions to information recording technology exemplify the spirit of innovation. His patent and career achievements highlight his dedication to improving data management systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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