This inventor holds 1 USPTO granted patent. Top assignee: Jfe Steel Corporation. Active years: 2004.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004
Title: Toru Fujimura: Innovator in X-ray Diffraction Technology
Introduction
Toru Fujimura is a notable inventor based in Chiba, Japan. He has made significant contributions to the field of materials science, particularly in the measurement of metal phases in galvanized layers. His innovative work has led to advancements in the production of galvanized steel sheets.
Latest Patents
Fujimura holds a patent for a "Quantitative measuring method and apparatus of metal phase using x-ray diffraction method, and method for making plated steel sheet using them." This invention provides a method and apparatus for quantitatively measuring a metal phase contained in a galvanized layer through X-ray diffractometry. The technology enhances measurement accuracy by increasing the diffracted X-ray intensity from the metal phase, allowing for on-line measurement applications. The X-ray beam produced by an X-ray source is optimized using a multilayer film mirror, which compresses and makes the beam parallel and monochromatic. This innovation is particularly useful for measuring the degree of alloying in hot-dip galvanization.
Career Highlights
Fujimura is currently employed at JFE Steel Corporation, where he continues to apply his expertise in materials science. His work has been instrumental in improving the quality and efficiency of galvanized steel production.
Collaborations
Fujimura collaborates with Akira Yamamoto, a fellow innovator in the field. Their partnership has fostered advancements in the technology surrounding metal phase measurement.
Conclusion
Toru Fujimura's contributions to X-ray diffraction technology and galvanized steel production exemplify the impact of innovation in materials science. His work continues to influence the industry and improve measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
