Company Filing History:
Years Active: 2013
Title: Torsten Jahnke: Innovator in Measurement Systems
Introduction
Torsten Jahnke is a notable inventor based in Munich, Germany. He has made significant contributions to the field of measurement systems, particularly through his work with scanning probe microscopes. His innovative approach has led to advancements in how measurement samples are examined.
Latest Patents
Torsten Jahnke holds a patent for a "Method for the operation of a measurement system with a scanning probe microscope and a measurement system." This invention relates to a method for operating a measurement system that includes a scanning probe microscope, specifically an atomic force microscope. The method involves displaying an optical image of a measurement section of a sample, detecting a position in the image, and moving a measurement probe to a corresponding measurement position based on a coordinate transformation.
Career Highlights
Torsten Jahnke has been instrumental in developing advanced measurement techniques that enhance the capabilities of scanning probe microscopy. His work has improved the precision and efficiency of examining measurement samples, making significant strides in the field.
Collaborations
Torsten collaborates with Michael Richard Haggerty, contributing to the advancement of measurement technologies and methodologies.
Conclusion
Torsten Jahnke's innovative work in measurement systems exemplifies the impact of inventors in advancing scientific research and technology. His contributions continue to influence the field of microscopy and measurement techniques.