Tokyo, Japan

Tooru Mori

This inventor holds 1 USPTO granted patent. Top assignee: Nec Corporation. Active years: 2012.


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Tooru Mori: Innovator in Spacer Technology

Introduction

Tooru Mori is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology through his innovative designs and patents. His work focuses on improving the reliability of connections in electronic devices.

Latest Patents

Tooru Mori holds a patent for a spacer and its manufacturing method. This invention addresses the issue of poor connections caused by solder suction when the clearance width between a soldered semiconductor device and a printed circuit board is constant. The spacer includes an electrically insulating base member and at least one solder guiding terminal. The design ensures that the bottom face and top face of the base member do not contact each other, while the side face can contact one or both of these faces. The solder guiding terminal partially covers the bottom and top faces, as well as the side face, with a solder guiding face that is not normal to the bottom face. This innovative design enhances the reliability of electronic connections.

Career Highlights

Tooru Mori is currently employed at NEC Corporation, where he continues to develop cutting-edge technologies. His work at NEC has allowed him to collaborate with other talented professionals in the field, further advancing his contributions to semiconductor technology.

Collaborations

One of his notable coworkers is Koichiro Masuda. Together, they have worked on various projects that aim to improve electronic device performance and reliability.

Conclusion

Tooru Mori's innovative work in spacer technology exemplifies the importance of advancements in semiconductor design. His contributions have the potential to significantly enhance the reliability of electronic devices, making him a key figure in the field.

Profile summary based on public USPTO records.
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