Mie, Japan

Tooru Mayumi

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Ntn Corporation. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tooru Mayumi. Retrieved from https://idiyas.com/inventor/tooru-mayumi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank


Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 10(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Tooru Mayumi: Innovator in Machine Components

Introduction

Tooru Mayumi is a notable inventor based in Mie, Japan. He has made significant contributions to the field of machine components, particularly through his innovative patent that enhances quality control and detection systems.

Latest Patents

Tooru Mayumi holds a patent for "Machine components having IC tags, quality control method and abnormality detecting system." This invention provides a machine component embedded with an IC tag, which ensures consistent control from manufacture to disposal. The IC tag consists of an IC chip that contains unique information about the machine component and an antenna that is electrically connected to the IC chip. This innovation addresses the challenge of maintaining the integrity of the IC tag throughout the lifecycle of the machine component.

Career Highlights

Tooru Mayumi is currently employed at NTN Corporation, where he continues to develop and refine his inventions. His work at NTN Corporation has allowed him to collaborate with other talented professionals in the field.

Collaborations

Some of Tooru Mayumi's coworkers include Mitsuo Sasabe and Shohei Nakamura. Their collective expertise contributes to the innovative environment at NTN Corporation.

Conclusion

Tooru Mayumi is a distinguished inventor whose work in machine components has the potential to revolutionize quality control methods. His patent reflects a commitment to innovation and excellence in engineering.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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