Tongxin Lu

Title: **Inventor Spotlight: Tongxin Lu**

Introduction

Tongxin Lu is an accomplished inventor based in San Jose, CA, known for his contributions to the field of optical measurement technologies. With a total of three patents to his name, his work primarily focuses on improving the inspection processes of semiconductor devices through innovative optical devices and techniques.

Latest Patents

Tongxin Lu's recent patents include groundbreaking inventions that enhance the functionality and efficiency of optical measurement systems. His first patent involves a **spectroscopic ellipsometer**, which discloses an optical measurement and inspection device. This invention allows for the inspection of semiconductor devices by utilizing a method that extracts essential information from a device-under-test (DUT). It involves multiple incoming polarized beams created using polarizers and focused on the DUT with a parabolic reflector, enabling detailed analysis of the collected beams.

Another significant invention is the **controllably variable optical attenuator**. This device comprises a pair of collimators connected to input and output fibers, featuring reflection devices positioned behind the collimators. The design incorporates a neutral density filter that can be moved to dynamically adjust optical attenuation, effectively enhancing control over light transmission.

Career Highlights

Throughout his career, Tongxin Lu has worked with several prominent companies, including Alliance Fiber Optic Products, Inc. and Raintree Scientific Instruments (Shanghai) Corporation. His expertise in optical technologies has allowed him to develop revolutionary devices that contribute significantly to the field.

Collaborations

Tongxin has collaborated with talented professionals in the industry, including Zheng Yan and Zhupei Shi. Their combined efforts have led to advancements that promote innovation and improve existing technologies in their respective areas.

Conclusion

With a portfolio of three patents and a dedication to advancing optical measurement systems, Tongxin Lu continues to make significant strides in the innovation landscape. His work not only assists in the progress of semiconductor inspection but also paves the way for future developments in optical technologies. As he progresses in his career, it will be exciting to see what further contributions he will make to the field.