This inventor holds 1 USPTO granted patent. Top assignee: Hitachi High-Tech Corporation. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Tomoko Shimamori: Innovator in Sample Inspection Technology
Introduction
Tomoko Shimamori is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of sample inspection technology. His innovative work has led to the development of a unique apparatus that enhances the accuracy of identifying electrical faults.
Latest Patents
Tomoko Shimamori holds a patent for a sample inspection apparatus. This apparatus is designed to identify capacitive faults or potential faulty points where electrical tolerance is low. The system includes a charged particle optical system that irradiates a sample with a charged particle beam. It also features a first probe that comes into contact with the sample, an amplifier connected to the probe, and a phase detection unit that processes the output signal from the amplifier. The phase detection unit utilizes a reference signal synchronized with an AC voltage applied to the first probe, allowing for precise detection of faults.
Career Highlights
Tomoko Shimamori is currently employed at Hitachi High-Tech Corporation, where he continues to innovate in the field of technology. His work has been instrumental in advancing the capabilities of sample inspection systems. With a focus on enhancing electrical fault detection, he has established himself as a key figure in his industry.
Collaborations
Tomoko has collaborated with several talented individuals, including Junichi Fuse and Yasuhiko Nara. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Tomoko Shimamori's contributions to sample inspection technology exemplify the impact of innovative thinking in engineering. His patent for a sample inspection apparatus showcases his commitment to improving fault detection methods. Through his work at Hitachi High-Tech Corporation, he continues to push the boundaries of technology and inspire future innovations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
