Musashino, Japan

Tomohito Nouno

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Yokogawa Electric Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomohito Nouno. Retrieved from https://idiyas.com/inventor/tomohito-nouno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Tomohito Nouno

Introduction

Tomohito Nouno is a notable inventor based in Musashino, Japan. He has made significant contributions to the field of physical quantity measurement. His innovative work has led to the development of a unique patent that enhances measurement techniques.

Latest Patents

Tomohito Nouno holds a patent for a "Physical quantity measuring apparatus and physical quantity measuring method." This patent includes a comprehensive method that involves generating a synchronized input signal, measuring pulse totals, and calculating average pulse numbers. The method is designed to improve the accuracy and efficiency of physical quantity measurements.

Career Highlights

Nouno is currently employed at Yokogawa Electric Corporation, where he applies his expertise in measurement technology. His work at the company has allowed him to further develop his innovative ideas and contribute to advancements in the industry.

Collaborations

One of his notable coworkers is Akihiro Ooshima. Together, they work on projects that aim to push the boundaries of measurement technology.

Conclusion

Tomohito Nouno's contributions to the field of physical quantity measurement through his patent and work at Yokogawa Electric Corporation highlight his role as an influential inventor. His innovative methods continue to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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