Choufu, Japan

Tomohiro Sato

This inventor holds 1 USPTO granted patent, plus 1 CIPO patent and 1 EPO patent. Top assignee: Rakuten, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tomohiro Sato. Retrieved from https://idiyas.com/inventor/tomohiro-sato-j720dqd6

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0



Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Tomohiro Sato: Innovator in Image Processing Technology

Introduction

Tomohiro Sato is a notable inventor based in Choufu, Japan. He has made significant contributions to the field of image processing, particularly through his innovative patent that addresses the transformation of target images lacking clear contours.

Latest Patents

Sato holds a patent for an image processing apparatus, image processing method, image processing program, and recording medium. This invention provides a method for transforming a target image that does not have contour of straight line portions. The process involves calculating an ellipse that approximates the target image, deciding a center candidate, and calculating a projective transformation matrix to obtain a transformation image.

Career Highlights

Tomohiro Sato is currently employed at Rakuten, Inc., where he continues to develop and refine his expertise in image processing technologies. His work has been instrumental in advancing the capabilities of image processing systems.

Collaborations

Sato has collaborated with notable colleagues, including Rikio Onai and Masaya Mori, who have contributed to his projects and innovations in the field.

Conclusion

Tomohiro Sato's contributions to image processing technology exemplify the impact of innovative thinking in solving complex problems. His patent reflects a commitment to advancing the field and enhancing image processing capabilities.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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