Spokane, WA, United States of America

Tom Matelich

This inventor holds 1 USPTO granted patent. Top assignee: Zetec, Inc.. Active years: 2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tom Matelich. Retrieved from https://idiyas.com/inventor/tom-matelich

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2013

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1 patent (USPTO):Explore Patents

Title: Innovations by Tom Matelich in Non-Destructive Testing

Introduction

Tom Matelich is an accomplished inventor based in Spokane, WA (US). He has made significant contributions to the field of non-destructive testing, particularly through his innovative patent that focuses on automated eddy current analysis. His work is instrumental in enhancing the accuracy and efficiency of flaw detection in tubing.

Latest Patents

Tom Matelich holds a patent for "Methods for automated eddy current non-destructive testing analysis." This patent describes a system and method for precisely detecting tubing flaws using a computer architecture that combines scalable processing power with an extensible array of detection and classification possibilities involving eddy current data analysis. The detection algorithms he developed are designed to pinpoint exact tubing regions, which can be further divided into manageable segments for flaw analysis. Multiple classification tools are utilized to discriminate detection and to assign proper report codes to detect flaws repeatedly and accurately.

Career Highlights

Tom Matelich is currently employed at Zetec, Inc., where he continues to innovate in the field of non-destructive testing. His expertise and dedication to improving testing methodologies have made him a valuable asset to his company and the industry as a whole.

Collaborations

Tom collaborates with his coworker, Jeff Strizzi, to further advance their projects and enhance the capabilities of their testing systems.

Conclusion

Tom Matelich's contributions to non-destructive testing through his innovative patent demonstrate his commitment to improving safety and efficiency in industrial applications. His work continues to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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