Company Filing History:
5 out of 11 
2 out of 128 
2 out of 2 
Years Active: 1979-2015
Title: The Innovative Contributions of Tom Lee Erb
Introduction
Tom Lee Erb is a notable inventor based in Austin, TX, who has made significant contributions to the field of guided microwave spectroscopy. With a total of 11 patents to his name, Erb's work focuses on advancing technologies that analyze materials using innovative methods.
Latest Patents
Among his latest patents is the invention of a guided wave cutoff spectroscopy system utilizing a cylindrical measurement cell. This system is designed for analyzing flowing materials through guided microwave spectroscopy. The cylindrical waveguide features spaced apart plates that define a plane parallel to the material flow direction. Additionally, the design includes two opposed frames surrounding an aperture, allowing access to the region between the waveguide plates. A microwave probe assembly is mounted at each frame to facilitate the radiation and reception of electromagnetic waves within the housing. Another significant patent involves signal processing in guided wave cutoff spectroscopy, which eliminates the need for automatic gain control by providing multiple signal processing paths with differing fixed voltage gains. This innovation allows for simultaneous amplification of emitted signals from a test chamber, enabling precise digital signal processing to determine material parameters.
Career Highlights
Throughout his career, Tom Lee Erb has worked with reputable companies such as Ramsey Engineering Company and Thermo Fisher Scientific GmbH. His experience in these organizations has contributed to his expertise in the field of microwave spectroscopy and material analysis.
Collaborations
Erb has collaborated with notable coworkers, including Wendell D. Miller and Darrel Thomas Butler, who have contributed to his innovative projects and research endeavors.
Conclusion
Tom Lee Erb's contributions to guided microwave spectroscopy and material analysis demonstrate his commitment to innovation and advancement in technology. His patents reflect a deep understanding of the complexities involved in analyzing materials, making him a significant figure in his field.