Tom Daenen

Title: Tom Daenen: Innovator in Semiconductor Device Testing

Introduction

Tom Daenen is a notable inventor based in Leuven, Belgium. He has made significant contributions to the field of semiconductor device testing, particularly through his innovative methods for evaluating current-voltage characteristics.

Latest Patents

Tom Daenen holds a patent for a method of determining current-voltage characteristics of a device. This invention focuses on evaluating the current-voltage characteristics of devices that exhibit negative resistance behavior. The method allows for accurate assessment of electrical overstress or ESD performance of semiconductor devices during the voltage transition region. By applying a signal with at least two amplitudes, the device's IV characteristics can be comprehensively extracted without being limited by the system loadline.

Career Highlights

Throughout his career, Tom Daenen has worked with prominent organizations such as the Interuniversitair Microelektronica Centrum (imec) and Imec. His work has been instrumental in advancing the understanding and testing of semiconductor devices.

Collaborations

Tom has collaborated with notable professionals in his field, including Natarajan Mahadeva Iyer and Steven Thijs. Their combined expertise has contributed to the development of innovative testing methods.

Conclusion

Tom Daenen's contributions to semiconductor device testing through his patented methods highlight his role as an influential inventor in the field. His work continues to impact the evaluation of electronic devices, ensuring better performance and reliability.