Plymouth, MN, United States of America

Tom Bartsch

This inventor holds 1 USPTO granted patent. Top assignee: Intercomp Company. Active years: 1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Tom Bartsch. Retrieved from https://idiyas.com/inventor/tom-bartsch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 23(Granted Patents)


Company Filing History:


Years Active: 1997

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1 patent (USPTO):Explore Patents

Title: The Innovations of Tom Bartsch

Introduction

Tom Bartsch is an accomplished inventor based in Plymouth, MN (US). He has made significant contributions to the field of aircraft weighing technology. His innovative approach has led to the development of a unique product that enhances the efficiency and accuracy of aircraft weight measurement.

Latest Patents

Tom Bartsch holds a patent for an "Aircraft weighing scale with improved base, platform and load cell." This portable aircraft weighing scale is designed to provide precise weight measurements, which are crucial for aircraft safety and performance.

Career Highlights

Tom Bartsch is currently employed at Intercomp Company, where he continues to innovate and develop new technologies. His work at Intercomp has positioned him as a key player in the aviation industry, particularly in the realm of weighing solutions.

Collaborations

Throughout his career, Tom has collaborated with notable colleagues, including William P Kroll and Mark Browne. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Tom Bartsch's contributions to aircraft weighing technology exemplify his dedication to innovation and excellence. His patent and work at Intercomp Company highlight his role as a significant inventor in the aviation sector.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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