Tohru Ida

Title: Tohru Ida: Innovator in Pattern Inspection Technology

Introduction

Tohru Ida is a notable inventor based in Tokyo, Japan, renowned for his contributions to pattern inspection technology. With two patents to his name, Ida showcases a profound understanding of advanced imaging techniques tailored for the precision manufacturing industry. His inventions are pivotal in enhancing the efficiency and accuracy of defect detection.

Latest Patents

Ida's latest patents include a Pattern Inspection Method and Apparatus, and a Pattern Alignment Method. The pattern inspection method involves aligning a master pattern as a reference with a continuous tone image of a pattern that is being measured. The system uses a camera to detect the position of a base in the continuous tone image based on the master pattern. By setting a threshold based on the density value difference of the base, the continuous tone image is binarized, enabling effective comparison with the master pattern to identify defects.

Additionally, his inspection status display method allows real-time confirmation of defects. This method displays a defect image alongside the corresponding master pattern image and provides buttons for designating defects as non-defective or due to dust, which helps streamline the inspection process and improves accuracy.

Career Highlights

Tohru Ida is currently employed at Nippon Avionics Co., Ltd., where he applies his technical skills and inventive mindset. His role involves collaboration on projects focused on enhancing inspection technologies to meet the rigorous demands of modern manufacturing.

Collaborations

Ida's work is enriched by collaboration with his skilled colleagues, including Shinichi Hattori and Shuzo Matsuno. Together, they contribute to the innovative environment at Nippon Avionics Co., Ltd., pushing the boundaries of pattern inspection technology.

Conclusion

Tohru Ida stands out in the field of pattern inspection with his significant patents that address key technological challenges in defect detection. His contributions not only advance the capabilities of inspection methods but also exemplify the spirit of innovation that drives the industry forward.