The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 06, 2005

Filed:

Mar. 13, 2003
Applicants:

Shinichi Hattori, Tokyo, JP;

Tohru Ida, Tokyo, JP;

Inventors:

Shinichi Hattori, Tokyo, JP;

Tohru Ida, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G09G005/00 ; G06F019/00 ; G06F017/50 ; G06K009/00 ;
U.S. Cl.
CPC ...
Abstract

An object of this invention is to confirm the content of a defect in real time. A defect image, corresponding master pattern image, failure designation button, nondefective designation button, dust designation button, piece number, piece coordinates, and the type of defect are displayed within a defect image region in an inspection status display window. When the nondefective designation button or dust designation button is selected, the inspecting apparatus recognizes that a defect corresponding to the selected button is negligible, and changes the inspection result of this defect from the defect to a nondefective.


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