Kennebunk, ME, United States of America

Todd Wayne Karry

This inventor holds 2 USPTO granted patents. Top assignee: National Semiconductor Corporation. Active years: 2007-2009.


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2007-2009

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2 patents (USPTO):Explore Patents

Title: The Innovations of Todd Wayne Karry

Introduction

Todd Wayne Karry is an accomplished inventor based in Kennebunk, ME (US). He has made significant contributions to the field of integrated circuit memory devices. With a total of 2 patents, his work has had a notable impact on technology and engineering.

Latest Patents

Karry's latest patents focus on a system and method for providing testing and failure analysis of integrated circuit memory devices. This innovative system involves creating a plurality of test circuits, each incorporating a physical fault in a memory bit cell. Each test circuit generates a distinct electrical signature due to the presence of the physical fault. The electrical signatures from these test circuits are then compared with signals from an integrated circuit memory device to determine if any of the physical faults are present in the device.

Career Highlights

Todd Wayne Karry is currently employed at National Semiconductor Corporation, where he continues to develop and refine his innovative ideas. His work at the company has allowed him to collaborate with other talented professionals in the field.

Collaborations

One of his notable coworkers is Lee James Jacobson, with whom he has likely shared insights and expertise in their projects.

Conclusion

Todd Wayne Karry's contributions to the field of integrated circuit memory devices demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of technology and its applications.

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