Todd W Murray

Title: The Innovations of Todd W. Murray: A Pioneer in Ultrasonic Detection Technologies

Introduction

Todd W. Murray, an accomplished inventor based in Medford, MA, has made significant contributions to the field of ultrasonic detection technologies. With a total of five patents to his name, his work focuses on enhancing the detection and imaging processes in semiconductor technology and beyond. This article delves into his latest patents, career highlights, and collaborations that have marked his innovative journey.

Latest Patents

Murray's foremost patent is a groundbreaking device for laser-ultrasonic detection of flip chip attachment defects. This device uniquely identifies underfill voids and solder ball defects through laser generation and detection of ultrasonic waves at the flip chip's surface. This innovation offers high resolution by utilizing small laser spot sizes and closely spaced laser beams with wavelengths that absorb near the semiconductor surface. Key advancements include improved spatial resolution and the ability to eliminate unwanted scattered waves by confining the ultrasonic waveform’s time frame to the first longitudinal wave reflection from the chip's underside. Notably, it has demonstrated resolution capabilities of less than 100 µm for silicon flip chips.

Another significant patent involves a non-destructive imaging, characterization, or measurement technique for thin items that employs laser-generated Lamb waves. This laser-based ultrasonic method utilizes an amplitude-modulated laser source to excite narrow bandwidth Lamb waves, resulting in a sharp resonance peak at the minimum frequency of the first-order symmetric Lamb mode. Experimental outcomes have illustrated that this zero group velocity resonance, generated with low-power modulated excitation, can be detected using optical probes like a Michelson interferometer coupled to a lock-in amplifier. This resonance peak is notably sensitive to the thickness and mechanical properties of plates, making it invaluable for the measurement and mapping of nanoscale thickness variations.

Career Highlights

Todd W. Murray has notably contributed to several prestigious organizations throughout his career, including Boston University and Optech Ventures, LLC. His work at these institutions has allowed him to explore advanced concepts in ultrasonic wave detection and imaging, pushing the limits of current technologies in practical applications.

Collaborations

Murray has collaborated with prominent figures in the field, including Marvin E. Klein and Claire Prada. These partnerships have fostered a dynamic exchange of ideas and innovations, further enriching the research and development initiatives undertaken by Murray and his colleagues.

Conclusion

In conclusion, Todd W. Murray exemplifies the spirit of innovation through his patents and collaborative efforts. His pioneering work in ultrasonic detection technologies not only enhances the quality and efficiency of semiconductor applications but also opens new avenues for research in non-destructive evaluation methods. As he continues to push the boundaries of what is possible, his contributions are sure to have a lasting impact on the industry.