Apple Valley, MN, United States of America

Todd Purkey

This inventor holds 2 USPTO granted patents and 2 published patent applications and 1 EPO patent. Top assignee: General Mills, Inc.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Todd Purkey. Retrieved from https://idiyas.com/inventor/todd-purkey-iupu72if

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 100.0

 

Average Co-Inventor Count = 3.4

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2015

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2 patents (USPTO):Explore Patents

Title: The Innovations of Todd Purkey

Introduction

Todd Purkey is an accomplished inventor based in Apple Valley, MN (US). He has made significant contributions to the field of packaging, particularly in the food industry. With a total of 2 patents to his name, Purkey's work has been recognized for its innovative approach to product design.

Latest Patents

Among his latest patents are the "Expandable Gusseted Sleeve for a Pouch" and the "Vented Package." The latter describes dough packages and packaged dough products that include microvents, enhancing the functionality and usability of food packaging.

Career Highlights

Purkey has had a notable career, working with prominent companies such as General Mills, Inc. and General Mills Marketing, Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas in packaging technology.

Collaborations

Throughout his career, Todd has collaborated with talented individuals, including Ali El-Afandi and Christopher Scott. These partnerships have contributed to the successful development of his patented inventions.

Conclusion

Todd Purkey's contributions to the field of packaging innovation demonstrate his commitment to improving product design and functionality. His patents reflect a deep understanding of consumer needs and industry standards.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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