This inventor holds 3 USPTO granted patents and 3 published patent applications. Top assignee: Northwestern University. Active years: 2019-2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2019-2026
Title: Innovations by Todd Parrish: Advancements in Medical Imaging
Introduction
Todd Parrish is an accomplished inventor based in Evanston, IL (US). He has made significant contributions to the field of medical imaging, particularly in the detection and analysis of intracranial hemorrhages. With a total of 3 patents, his work is at the forefront of technological advancements in healthcare.
Latest Patents
One of Todd Parrish's latest patents is titled "Precise slice-level localization of intracranial hemorrhage on head CTS with networks trained on scan-level labels." This innovative workflow utilizes a weakly supervised deep learning model that combines a convolutional neural network and a recurrent neural network. The model is trained on a large dataset of CT scans, with expert-labeled slices indicating the presence or absence of intracranial hemorrhage (ICH). The use of transfer learning allows for further training on a second dataset, enhancing the model's accuracy in predicting ICH. The model generates heatmaps that highlight significant regions of the CT scans, providing valuable insights for diagnosis.
Another notable patent is the "System and method for acquiring both T2*-weighted and T1-weighted data in a single acquisition using a single dose of contrast agent." This invention describes a method for obtaining measurements of tissue perfusion and permeability using an MRI system. By monitoring signal values for a trigger event, the MRI system can switch from acquiring T2*-weighted data to T1-weighted data, allowing for a fully automated process that requires only a single dose of contrast agent.
Career Highlights
Todd Parrish is affiliated with Northwestern University, where he continues to push the boundaries of medical imaging technology. His work has garnered attention for its innovative approach to improving diagnostic accuracy and efficiency in clinical settings.
Collaborations
Throughout his career, Todd has collaborated with talented individuals such as Yu Fen Chen and Amit Sanjay Adate. These partnerships have contributed to the development of groundbreaking technologies in the medical field.
Conclusion
Todd Parrish's contributions to medical imaging through his patents demonstrate his commitment to advancing healthcare technology. His innovative approaches have the potential to significantly improve patient outcomes and diagnostic processes.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
